To achieve customer satisfaction over the life of a product, the prediction of that product's behavior in the customers' hands is absolutely essential. Reliability must be designed into the product as it is developed. This paper presents a method for accelerating test time-to-failure, while demonstrating the product's reliability. The methodologies described uphold the basic principals of reliability and offer the capability of minimizing test time while maximizing the ability to assure performance and durability.


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    Titel :

    The Reliability of Overstress Testing


    Weitere Titelangaben:

    Sae Technical Papers


    Beteiligte:
    Rudy, W. Harry (Autor:in)

    Kongress:

    Aerospace Atlantic Conference & Exposition ; 1990



    Erscheinungsdatum :

    01.04.1990




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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