Engineers doing squeak and rattle testing of instrument panels (IP's) have successfully used large electrodynamic vibration systems to identify sources of squeaks and rattles (S&R's). Their successes led to demands to test more IP's, i.e., to increase throughput of IP's to reflect the many design, material, and/or manufacturing process changes that occur, and to do so at any stage of the development, production, or QA process. What is needed is a radically different and portable way to find S&R's in a fraction of the time and at lower capital cost without compromising S&R detection results.


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    Titel :

    “Next Generation” Means for Detecting Squeaks and Rattles in Instrument Panels


    Weitere Titelangaben:

    Sae Technical Papers


    Beteiligte:

    Kongress:

    SAE Noise and Vibration Conference and Exposition ; 1997



    Erscheinungsdatum :

    1997-05-20




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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    Rusen,W.M. / Peterson,E.L. / McCormick,R.E. et al. | Kraftfahrwesen | 1997


    "Next Generation" Means for Detecting Squeaks and Rattles in Instrument Panels

    Rusen, W. M. / Peterson, E. L. / McCormick, R. E. et al. | British Library Conference Proceedings | 1997


    "Next-generation" detection of squeaks and rattles in IPs

    Rusen, W. M. / Peterson, E. L. / McCormick, R. E. et al. | British Library Online Contents | 1997


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