With the rapidly increasing insertion of photonic devices, circuits and subsystems into NASA spacecraft, a variety of issues associated with reliability and radiation tolerance have arisen. In this paper, we discuss these issues from the perspective of the work currently ongoing in the NASA Electronic Parts and Packaging (NEPP) Program. This Program is focused on evaluating the reliability and radiation response of advanced and emerging microelectronics and photonics technologies of interest to NASA spacecraft system designers.


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    Titel :

    Recent photonics activites under the NASA electronic parts and packaging (NEPP) program


    Beteiligte:
    Miyahira, T. (Autor:in) / Marshall, C. (Autor:in) / Reed, R. (Autor:in) / LaBel, K. (Autor:in) / Johnston, A. (Autor:in) / Ott, M. (Autor:in) / Barnes, C. E. (Autor:in)

    Erscheinungsdatum :

    2002-07-07


    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch


    Schlagwörter :


    Recent photonics activities under the NASA Electronic Parts and Packaging (NEPP) program

    Barnes, Charles E. / Ott, Melanie N. / Johnston, Allan H. et al. | SPIE | 2002


    Recent photonics activities under the NASA Electronic Parts and Packaging (NEPP) program (4823-28)

    Barnes, C. E. / Ott, M. N. / Johnston, A. H. et al. | British Library Conference Proceedings | 2002


    NASA Electronic Parts and Packaging (NEPP) Program

    K. A. LaBel / M. J. Sampson | NTIS | 2008


    NASA Electronic Parts and Packaging (NEPP) Program

    LaBel, Kenneth A. / Sampson, Michael J. | NTRS | 2008


    State of NEPP NASA Electronic Parts & Packaging Program

    P. Majewicz / J. Pellish / S. Agarwal | NTIS | 2020