The purpose of this testing was to characterize the Texas Instruments SNV54LVC00AW for single-event latchup (SEL) in support of a NASA GSFC flight program. The SNV54LVC00A quadruple 2-input positive-NAND gate. These devices were tested at the Berkeley Accelerator Space Effects (BASE) Facility at Lawrence Berkeley National Laboratory (LBNL) where they were irradiated with the 10 MeV/amu heavy ion cocktail.


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    Titel :

    Single-Event Testing of the Texas Instruments SNV54LVC00AW Quadruple 2-Input Positive-NAND Gates


    Beteiligte:
    Campola, Michael (Autor:in) / Carstens, Tom (Autor:in)

    Erscheinungsdatum :

    2020-01-13


    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch





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