NASA, the aerospace community, and other high reliability (hi-rel) users of advanced microelectronic products face many challenges as technology continues to scale into the deep sub- micron region and ULP devices are sought after. Technology trends, ULP microelectronics, scaling and performance tradeoffs, reliability considerations, and spacecraft environments will be presented from a ULP perspective for space applications.


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    Titel :

    Reliability Considerations for Ultra- Low Power Space Applications


    Beteiligte:
    White, Mark (Autor:in) / Johnston, Allan (Autor:in)

    Kongress:

    IEEE International Reliability Physics Symposium (IRPS 2012) ; 2012 ; Anaheim, CA, United States


    Erscheinungsdatum :

    15.04.2012


    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch




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