The identification of patterns of software defect data yields insights into improving the quality of both operational and future spacecraft. This paper describes the results of applying this technique to both post-launch and pre-launch spacecraft. It then describes four key challenges that remain to achieving fuller utilization of defect analysis in future systems.


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    Titel :

    Patterns of software defect data on spacecraft


    Beteiligte:
    Lutz, R. R. (Autor:in) / Mikulski, I. C. (Autor:in)

    Kongress:

    NASA Space Mission Challenges for Information


    Erscheinungsdatum :

    2003-07-13


    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Keine Angabe


    Sprache :

    Englisch




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