The directional hemispheric reflecatance is measured for Spectralon, the material chosen for on-board radiometric calibration of the Multiangle Imaging SpectroRadiometer (MISR), at laser wavelengths of 442, 632.8 and 859.9nm.
The Measurement of the Directional Hemispherical Reflectance From Spectralon
01.09.1997
Preprint
Keine Angabe
Englisch
Hemispherical emissivity by infrared reflectance
British Library Conference Proceedings | 2005
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