The table of contents include the following: hardware identification and configuration; qualification summary; qualification test data results; special test data; engineering rational to support analysis vs testing; qualification failure and corrective action; and qualification certificate.


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    Titel :

    Microelectronics Instrument Products Shock and Vibration Electro-Optics


    Erscheinungsdatum :

    12.06.1995


    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch




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