A wide variety of materials and experiment support hardware were flown on the Long Duration Exposure Facility (LDEF). Postflight testing has determined the effects of the almost 6 years of low-earth orbit (LEO) exposure on this hardware. An overview of the results are presented. Hardware discussed includes adhesives, fasteners, lubricants, data storage systems, solar cells, seals, and the LDEF structure. Lessons learned from the testing and analysis of LDEF hardware is also presented.


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    Titel :

    Summary of materials and hardware performance on LDEF


    Beteiligte:
    Dursch, Harry (Autor:in) / Pippin, Gary (Autor:in) / Teichman, Lou (Autor:in)


    Erscheinungsdatum :

    1993-12-01


    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Keine Angabe


    Sprache :

    Englisch


    Schlagwörter :


    Summary of Materials and Hardware Performance on LDEF

    Dursch, H. / Pippin, G. / Teichman, L. et al. | British Library Conference Proceedings | 1994


    LDEF Polymeric Materials: A Summary of Langley Characterization

    Young, P. R. / Slemp, W. S. / Whitley, K. S. et al. | British Library Conference Proceedings | 1995



    Summary of LDEF Battery Analyses

    C. Johnson / L. Thaller / H. Bittner et al. | NTIS | 1992


    LDEF Materials Overview

    B. A. Stein | NTIS | 1993