Internal and surface voids of known sizes incorporated into silicon carbide and silicon nitride ceramic reference specimens at prescribed locations. Specimens used to demonstrate sensitivity and resolution in nondestructive examination techniques like scanning laser acoustic microscopy and x-radiography, and to assist in establishing proper examination procedures.
Making Ceramic Reference Specimens Containing Seeded Voids
NASA Tech Briefs ; 18 , 12
01.12.1994
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Englisch
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