An intensive 2-day conference to discuss the current status of measurement technology in the areas of temperature/heat flux, stress/strain, pressure, and flowfield diagnostics for high temperature aerospace applications was held at Langley Research Center, Hampton, Virginia, on April 22 and 23, 1993. Complete texts of the papers presented at the Conference are included in these proceedings.


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    Titel :

    The 1992 NASA Langley Measurement Technology Conference: Measurement Technology for Aerospace Applications in High-Temperature Environments


    Beteiligte:

    Erscheinungsdatum :

    1992-09-01


    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch





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