Semiautomatic eddy-current-probe apparatus makes noncontact measurements of nominally round holes in electrically conductive specimens and processes measurement data into diameters and eccentricities of holes. Includes x-y translation platform, which holds specimen and moves it horizontally. Probe mounted on probe scanner, positioning probe along vertical (z) direction and rotates probe about vertical axis at preset low speed. Eddy-current sensing coil mounted in side of probe near tip. As probe rotates, impedance analyzer measures electrical impedance (Z) of coil as function of instantaneous rotation angle. Translation and rotation mechanisms and impedance analyzer controlled by computer, which also processes impedance-measurement data.
Noncontact Measurement Of Sizes And Eccentricities Of Holes
NASA Tech Briefs ; 17 , 10
01.10.1993
Sonstige
Keine Angabe
Englisch
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