Technique for indirect calibration in electron-probe microanalysis reduces number of measurements needed without significantly degrading precision of measurement data. Advantageous when many analyses must be performed; for example, determining varying chemical composition at many positions across specimen of multicomponent alloy. Time spent acquiring data reduced considerably.
Indirect Calibration In Electron-Probe Microanalysis
NASA Tech Briefs ; 17 , 4
01.04.1992
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Englisch
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