Technique for indirect calibration in electron-probe microanalysis reduces number of measurements needed without significantly degrading precision of measurement data. Advantageous when many analyses must be performed; for example, determining varying chemical composition at many positions across specimen of multicomponent alloy. Time spent acquiring data reduced considerably.


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    Titel :

    Indirect Calibration In Electron-Probe Microanalysis


    Beteiligte:
    Terepka, F. M. (Autor:in) / Vijaykumar, M. (Autor:in) / Tewari, S. N. (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    01.04.1992



    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch


    Schlagwörter :


    Electron Probe Microanalysis of Light Elements

    R. Castaing / J. Descamps | NTIS | 1965


    Absorption tables for electron probe microanalysis

    Adler, I. / Goldstein, J. | TIBKAT | 1965


    Improved dewpoint-probe calibration

    Stephenson, J. G. / Theodore, E. A. | NTRS | 1978


    Diesel deposits forming tendencies - microanalysis method

    Perez,J.M. / Pei,P. / Zhang,Y. et al. | Kraftfahrwesen | 1991