Projected-fringe, phase-stepping profilometer is system of optical, electronic, optoelectronic, and electro-optical equipment measuring surface profiles of objects. Projects optical interference pattern onto object and steps phase of pattern to extract phases of interfering beams where they intersect object. Data obtained within seconds. Noncontact, full-field surface profilometer has applications, including inspection of machined and ceramic parts, printed circuit boards, and optical components. Rugged and compact, measures surfaces with variety of sizes and finishes.


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    Titel :

    Projected-Fringe, Phase-Stepping Profilometer


    Beteiligte:
    Mercer, Carolyn (Autor:in) / Beheim, Glenn (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    1992-09-01



    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch


    Schlagwörter :



    Projected-Fringe Profilometer Maps Erosion Of Electrode

    Macrae, Gregory S. / Mercer, Carolyn R. | NTRS | 1995


    Phase stepping fringe analysis applied to moire interferometry

    Brownell, J. B. / Parker, R. J. / Institute of Physics; Applied Optics Division et al. | British Library Conference Proceedings | 1990


    Spatial Phase Stepping Method of Fringe-Pattern Analysis

    Chan, P.-H. / Bryanston-Cross, P. J. / Parker, S. C. et al. | British Library Conference Proceedings | 1994


    Optical profilometer

    Burcher, E. E. / Kelly, W. L., IV / Katzberg, S. J. | NTRS | 1977