Projected-fringe, phase-stepping profilometer is system of optical, electronic, optoelectronic, and electro-optical equipment measuring surface profiles of objects. Projects optical interference pattern onto object and steps phase of pattern to extract phases of interfering beams where they intersect object. Data obtained within seconds. Noncontact, full-field surface profilometer has applications, including inspection of machined and ceramic parts, printed circuit boards, and optical components. Rugged and compact, measures surfaces with variety of sizes and finishes.
Projected-Fringe, Phase-Stepping Profilometer
NASA Tech Briefs ; 16 , 9
1992-09-01
Sonstige
Keine Angabe
Englisch
Projected-Fringe Profilometer Maps Erosion of Electrodes
Online Contents | 1995
Projected-Fringe Profilometer Maps Erosion Of Electrode
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|Phase stepping fringe analysis applied to moire interferometry
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|NTRS | 1977
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