Sensor probe follows curved contours, always keeping sensor in contact with contoured surface. Includes freely pivoting tip, which contains sensor. Spring holds tip in contact with surface being scanned. As user moves probe along surface, force of contact keeps tip oriented along local perpendicular to surface. Slopes of up to 90 degrees from axis of probe accommodated.
Contact Probe With Pivoting Tip
NASA Tech Briefs ; 15 , 11
01.11.1991
Sonstige
Keine Angabe
Englisch
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