Proposed technique for measuring shapes and alignments of reflectors based on use of two-wavelength absolute-distance interferometer to generate optical-path-difference maps of reflecting or refracting surfaces. Facilitates such tasks as determining manufacturing and alignment errors of off-axis segment of large-aperture paraboloidal telescope mirror, or aligning all segments of such mirror. Suitable for use where reflecting surfaces highly aspherical, initial misalignments large, and/or surface errors exceed optical wavelengths.
Two-Wavelength Optical-Path-Difference Mapping
NASA Tech Briefs ; 14 , 11
1990-11-01
Sonstige
Keine Angabe
Englisch
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