Proposed technique for measuring shapes and alignments of reflectors based on use of two-wavelength absolute-distance interferometer to generate optical-path-difference maps of reflecting or refracting surfaces. Facilitates such tasks as determining manufacturing and alignment errors of off-axis segment of large-aperture paraboloidal telescope mirror, or aligning all segments of such mirror. Suitable for use where reflecting surfaces highly aspherical, initial misalignments large, and/or surface errors exceed optical wavelengths.


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    Titel :

    Two-Wavelength Optical-Path-Difference Mapping


    Beteiligte:

    Erschienen in:

    Erscheinungsdatum :

    1990-11-01



    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch


    Schlagwörter :


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