Device proposed to improve imaging of x rays. Features thin layer of oxide in virtual phase to increase quantum efficiency and depletion layer nearly as thick as epitaxial silicon layer to increase resolution. Applications include imaging spectrometers for x-ray astronomy, investigations of plasmas, and x-ray crystallography.
Improved Charge-Coupled Imager For X Rays
NASA Tech Briefs ; 12 , 5
01.05.1988
Sonstige
Keine Angabe
Englisch
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