Proposed apparatus for inspecting prefired ceramic materials detects minute flaws that might escape ordinary visual inspections. Method detects flaws and marks locations. Intended for such thin ceramic parts as insulation in capacitors and some radio-frequency filters.
Automatically Inspecting Thin Ceramics For Pinholes
NASA Tech Briefs ; 12 , 1
01.01.1988
Sonstige
Keine Angabe
Englisch
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