Test circuit for silicon solar cells suppresses spurious effects. New circuit increases accuracy of measurements of recombination lifetime and effective surface recombination velocity in silicon solar cell. Fast electronic switch, circuit grounds forward-biased cell so rapidly transient voltage to be measured not affected significantly.
Circuit for Lifetime and Surface-Recombination Measurements
NASA Tech Briefs ; 10 , 6
1986-11-01
Sonstige
Keine Angabe
Englisch
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