The two problems of enhanced electrostatic discharge (ESD) and contamination are discussed. It is shown that there is a synergistic relationship between them such that one enhances the probability of occurance of the other. The action of both provides substantially more deleterious affects than the effects of both separately. Mechanisms for such a relationship are discussed as well as application to large advanced technology systems.


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    Titel :

    Contamination enhanced electrostatic discharge mechanisms


    Beteiligte:
    Jeffrey, J. A. (Autor:in) / Maag, C. R. (Autor:in)


    Erscheinungsdatum :

    01.12.1979


    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Keine Angabe


    Sprache :

    Englisch




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