Laser-Scanning System pinpoints imperfections in solar cells. Entire solar panels containing large numbers of cells can be scanned. Although technique is similar to use of scanning electron microscope (SEM) to locate microscopic imperfections, it differs in that large areas may be examined, including entire solar panels, and it is not necessary to remove cover glass or encapsulants.


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    Titel :

    Solar-cell defect analyzer


    Beteiligte:
    Gauthier, M. K. (Autor:in) / Miller, E. L. (Autor:in) / Shumka, A. (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    01.04.1980



    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch


    Schlagwörter :


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