Faults in plated wire memories are identified and located from outside of system by applying electrical impulses and analyzing their reflectance in technique of Time-Domain Reflectometry (TDR). Intermittent faults are easier to find because memory system is not disturbed by probing or disassembly.
Troubleshooting plated-wire memories
NASA Tech Briefs ; 4 , 1
01.08.1979
Sonstige
Keine Angabe
Englisch
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