Device as part of integrated circuit protection line is used to detect presence or absence of silicon wafer at point along air track. System is insensitive to ambient light and electrical noise, requires no special components or adjustments, operates from single supply source, and is relatively inexpensive to build.
Modulation improves electro-optic object detector
NASA Tech Briefs ; 3 , 3
01.01.1979
Sonstige
Keine Angabe
Englisch
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