Over the last several years researchers at NASA Glenn and Ames Research Centers have developed a real-time fault detection and isolation system for propulsion subsystems of future space vehicles. The Propulsion IVHM Technology Experiment (PITEX), as it is called follows the model-based diagnostic methodology and employs Livingstone, developed at NASA Ames, as its reasoning engine. The system has been tested on flight-like hardware through a series of nominal and fault scenarios. These scenarios have been developed using a highly detailed simulation of the X-34 flight demonstrator main propulsion system and include realistic failures involving valves, regulators, microswitches, and sensors. This paper focuses on one of the recent research and development efforts under PITEX - to provide more complete transient region coverage. It describes the development of the transient monitors, the corresponding modeling methodology, and the interface software responsible for coordinating the flow of information between the quantitative monitors and the qualitative, discrete representation Livingstone.


    Zugriff

    Zugriff über TIB

    Verfügbarkeit in meiner Bibliothek prüfen


    Exportieren, teilen und zitieren



    Titel :

    Transient Region Coverage in the Propulsion IVHM Technology Experiment


    Beteiligte:
    E. Balaban (Autor:in) / A. Sweet (Autor:in) / A. Bajwa (Autor:in) / W. Maul (Autor:in) / C. Fulton (Autor:in)

    Erscheinungsdatum :

    2004


    Format / Umfang :

    8 pages


    Medientyp :

    Report


    Format :

    Keine Angabe


    Sprache :

    Englisch




    Transient Region Coverage in the Propulsion IVHM Technology Experiment

    Balaban, Edward / Sweet, Adam / Bajwa, Anupa et al. | NTRS | 2004


    Propulsion IVHM Technology Experiment

    Chicatelli, Amy K. / Maul, William A. / Fulton, Christopher E. | NTRS | 2006


    Propulsion IVHM technology experiment overview

    Meyer, C.M. / Fulton, C. / Maul, B. et al. | IEEE | 2003


    2.1401 Propulsion IVHM Technology Experiment Overview

    Institute of Electrical and Electronics Engineers | British Library Conference Proceedings | 2003