The purpose behind this work is to provide NASA Principal Investigators (PI) rapid information, non-destructively, about their samples. This information will be in the form of density values throughout the samples, especially within slices 1 mm high. With correct interpretation and good calibration, these values will enable the PI to obtain macro chemical compositional analysis for his/her samples. Alternatively, the technique will provide information about the porosity level and its distribution within the sample. Experience gained with a NASA MRD-sponsored Advanced Technology Development (ATD) project on this topic has brought the technique to a level of maturity at which it has become a viable characterization tool for many of the Materials Science PIs, but with equipment that could never be supported within their own facilities. The existing computed tomography (CT) facility at NASA's Kennedy Space Center (KSC) is ideally situated to furnish information rapidly and conveniently to PIs, particularly immediately before and after flight missions.


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    Titel :

    Use of Computed Tomography for Characterizing Materials Grown Terrestrially and in Microgravity


    Beteiligte:
    D. C. Gillies (Autor:in) / H. P. Engel (Autor:in)

    Erscheinungsdatum :

    2000


    Format / Umfang :

    2 pages


    Medientyp :

    Report


    Format :

    Keine Angabe


    Sprache :

    Englisch




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