A method is presented for finding the accurate power spectral density of infrared detector noise. The 1/f/sup r/ random process is described by wavelet functions and a maximum likelihood method is employed to estimate the parameter r.


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    Titel :

    An estimation method based on wavelet transformation for infrared image noise


    Beteiligte:
    Zhi-Yong Li (Autor:in) / Zhen-Kang Shen (Autor:in) / Wei-Ping Yang (Autor:in)


    Erscheinungsdatum :

    01.01.1996


    Format / Umfang :

    454187 byte





    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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