Near-field optical microscopy (NSOM) is a technique that offers several advantages over conventional optical microscopy. We present evidence for a z-polarization component and a surface-enhancement effect in near-field Raman data. Observation of Raman scattering from the fiber probe and Rayleigh scattering may be used to determine probe quality. The sample studied is KTiOPO/sub 4/ (KTP) a nonlinear optical material, for which a comparison of near-field and far-field spectra is shown.


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    Titel :

    Near-field Raman spectra: surface enhancement, z-polarization, fiber Raman background and Rayleigh scattering


    Beteiligte:
    Jahncke, C.L. (Autor:in) / Hallen, H.D. (Autor:in)


    Erscheinungsdatum :

    01.01.1996


    Format / Umfang :

    189920 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



    Near-Field Raman Spectra: Surface Enhancement, Z-Polarization, Fiber Raman Background and Rayleigh Scattering

    IEEE; Lasers and Electro-Optics Society | British Library Conference Proceedings | 1996




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