Near-field optical microscopy (NSOM) is a technique that offers several advantages over conventional optical microscopy. We present evidence for a z-polarization component and a surface-enhancement effect in near-field Raman data. Observation of Raman scattering from the fiber probe and Rayleigh scattering may be used to determine probe quality. The sample studied is KTiOPO/sub 4/ (KTP) a nonlinear optical material, for which a comparison of near-field and far-field spectra is shown.
Near-field Raman spectra: surface enhancement, z-polarization, fiber Raman background and Rayleigh scattering
01.01.1996
189920 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
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