This paper presents an analysis of SEE in-flight data on NAND flash memories on-board Technology Demonstration Module (TDM) flying on PROBA-II spacecraft. Proba-II spacecraft has been flying for more than 3 years on a LEO orbit. Observed in-flight error rates are compared with predictions based on ground test data.


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    Titel :

    NAND flash memory in-flight data from PROBA-II spacecraft


    Beteiligte:
    D'Alessio, M. (Autor:in) / Poivey, C. (Autor:in) / Walter, D. (Autor:in) / Gruermann, K. (Autor:in) / Gliem, F. (Autor:in) / Schmidt, H. (Autor:in) / Sorensen, R. Harboe (Autor:in) / Keating, A. (Autor:in) / Fleurinck, N. (Autor:in) / Puimege, K. (Autor:in)


    Erscheinungsdatum :

    2013-09-01


    Format / Umfang :

    1538100 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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