Efforts by the Department of Defense to increase use of commercial or dual-use technologies have resulted in the levying of new requirements on automatic test systems. One of the areas where requirements are being levied is in the exchange of diagnostic and maintenance information. These requirements have led to the creation or revision of several IEEE standards intended to support such information exchange. In this paper, we explain the nature of the revisions being made to IEEE STD 1232 (AI-ESTATE). We also explain the nature of the information being modeled for IEEE PI636 (SIMICA) and its relationship to AI-E STATE. Finally, we provide a discussion of a new XML-based exchange format being incorporated into AI-ESTATE, SIMICA, and related standards to satisfy exchange requirements under the DoD and industry-led automatic test markup language (ATML) initiative and explain the role of AI-ESTATE and SIMICA within the larger scope of ATML.


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    Titel :

    Recent advances in IEEE standards for diagnosis and diagnostic maturation


    Beteiligte:
    Sheppard, J.W. (Autor:in) / Wilmering, T.J. (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    2006-01-01


    Format / Umfang :

    300552 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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