One of the simplified models of semiconductor microdisk is based on the concept of the effective refraction index and leads to the 2D approximation that neglects the out-of-plane radiation of the lasing mode field. This paper aims to characterize this feature while still assuming the disk thin and high-contrast. A perfectly conducting disk is considered but modify it for an imperfect disk.
Arbitrary excitation of high-contrast thin dielectric disk
01.01.2003
133428 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
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