One of the simplified models of semiconductor microdisk is based on the concept of the effective refraction index and leads to the 2D approximation that neglects the out-of-plane radiation of the lasing mode field. This paper aims to characterize this feature while still assuming the disk thin and high-contrast. A perfectly conducting disk is considered but modify it for an imperfect disk.


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    Titel :

    Arbitrary excitation of high-contrast thin dielectric disk


    Beteiligte:
    Balaban, M.V. (Autor:in) / Nosich, A.I. (Autor:in)


    Erscheinungsdatum :

    01.01.2003


    Format / Umfang :

    133428 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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