The authors describe an integrated testing approach called the Maintenance and Diagnostic System (MADS), which was developed for digital avionics systems using VHSIC and semicustom devices. Mission/operational requirements dictate high availability with capability to detect 98% of all faults and isolate 90% of these faults to a line replacement module (LRM) or 95% of the faults to two LRMs. MADS achieves these goals by defining a module maintenance node (MMN) chip set for each LRM in the system and the design for testability concepts for hardware. The MMN aids parallel, high-speed testing of LRMs, isolating the fault(s) to a module/chip level while incurring less than 10% overhead. It uses the concepts of scan set design, pseudorandom test vector generation, output response compression, and separate scan set loops to test the SSI-MSI logic on the LRM. It also stores interim test results and run-time fault information to isolate the hard-to-reproduce failures and performs verification of interchip and intermodule wiring.<>
Design for testability for future digital avionics systems
IEEE Aerospace and Electronic Systems Magazine ; 3 , 6 ; 2-6
1988-06-01
336065 byte
Aufsatz (Zeitschrift)
Elektronische Ressource
Englisch
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