A method based on undercut-etching-active-region is proposed to enhance the high-speed performance of the traveling wave electroabsorption modulator. It is found that increasing the widths of p-and n-cladding layer with the same i-layer to reduce the resistances in p-i-n waveguide can improve the microwave propagation loss and thus the high-speed electrooptical response.


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    Titel :

    Microwave Performance of Undercut Active Region for Traveling Wave Electroabsorption Modulator


    Beteiligte:
    Lin, F.J. (Autor:in) / Wu, T.H. (Autor:in) / Chiu, Y.J. (Autor:in)


    Erscheinungsdatum :

    01.01.2005


    Format / Umfang :

    181193 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



    High-Speed Undercut-Wet-Etching-Active-Region Traveling-Wave Electroabsorption Modulator

    IEEE Lasers and Electro-optics Society | British Library Conference Proceedings | 2005



    Undercut etching the active region of the waveguide for traveling-wave electroabsorption modulator

    Cheng, W. C. / Chiu, Y.-J. / Guo li Taiwan da xue et al. | British Library Conference Proceedings | 2003