Laser terahertz emission microscope (LTEM) is proposed and developed. Two-dimensional images of THz emission are successfully captured from various kinds of materials and devices. The results suggest that the LTEM system will be a useful tool for scientific imaging, and inspecting LSI chips.


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    Titel :

    Laser terahertz emission microscope and its application


    Beteiligte:
    Tonouchi, M. (Autor:in)


    Erscheinungsdatum :

    2005-01-01


    Format / Umfang :

    165616 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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