An improved technique for measuring the refractive index profile of optical waveguides using a modified confocal scanning optical microscope with a stable light source, a low signal system, and a simple feedback scheme is described.


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    Titel :

    Improved Reflection-Method for Refractive Index Measurements of Optical Waveguides


    Beteiligte:
    Youk, Y. (Autor:in) / Dug Young Kim, (Autor:in)


    Erscheinungsdatum :

    01.01.2005


    Format / Umfang :

    231331 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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