In order to eliminate the focus deformation and at the same time localize the field near the interface, a tightly focused evanescent field combining with a radially polarized illumination, generated by interference method with a single LCD, is proposed in this paper. A scanning near-field optical microscope (SNOM) has been employed to observe the focal spot near the interface by means of directly scanning over the focal field.
Focused evanescent field under radially polarized beam illumination
01.01.2005
171737 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
Focused Evanescent Field under Radially Polarized Beam Illumination
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