In order to eliminate the focus deformation and at the same time localize the field near the interface, a tightly focused evanescent field combining with a radially polarized illumination, generated by interference method with a single LCD, is proposed in this paper. A scanning near-field optical microscope (SNOM) has been employed to observe the focal spot near the interface by means of directly scanning over the focal field.


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    Titel :

    Focused evanescent field under radially polarized beam illumination


    Beteiligte:
    Baohua Jia, (Autor:in) / Xiaosong Gan, (Autor:in) / Min Gu, (Autor:in)


    Erscheinungsdatum :

    01.01.2005


    Format / Umfang :

    171737 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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