In order to measure the anisotropic optical constants of thin films accurately, the sensitivity of attenuated total reflection curve is analyzed. According to the analysis, two curve fitting procedures are developed to determine two principal indices of refraction and principal axes orientation.
Optical constants determination of an anisotropic thin film by attenuated total reflection method analyzed by sensitivity calculation
01.01.2003
23077 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
British Library Conference Proceedings | 2003
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