In this work we present an investigation principally aimed at determining the threshold in HfO/sub 2/ concentration above which no further reduction of photorefraction is obtained. The measurements are made by inducing photorefraction with a 532-nm laser beam on a set of congruent LN crystals doped with increasing HfO/sub 2/ concentration.


    Zugriff

    Zugriff prüfen

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Photorefractivity of hafnium-doped congruent lithium-niobate crystals


    Beteiligte:
    Cristiani, I. (Autor:in) / Razzari, L. (Autor:in) / Minzioni, P. (Autor:in) / Degiorgio, V. (Autor:in) / Kokanyan, E.P. (Autor:in)


    Erscheinungsdatum :

    2005-01-01


    Format / Umfang :

    194734 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



    Photorefractivity of hafnium-doped congruent lithium niobate crystals

    Minzioni, P. / Razzari, L. / Cristiani, I. et al. | IEEE | 2005


    Photorefractivity of Hafnium-Doped Congruent Lithium Niobate Crystals

    Minzioni, P. | British Library Conference Proceedings | 2005



    Schlieren imaging of inverted domains in congruent lithium niobate

    Paturzo, M. / Ferraro, P. / Grilli, S. et al. | IEEE | 2005


    Schlieren imaging of inverted domains in congruent lithium niobate

    Paturzo, M. / Ferraro, P. / Grilli, S. et al. | IEEE | 2005