One of the biggest challenges associated with testing the linearity of high performance Analog-to-Digital Converters (ADCs) is generating a test stimulus more linear or spectrally more pure than the device under test. In this paper we propose algorithms that allow easy to generate, imprecise sinusoidal excitations that differ by a constant voltage to characterize the Integral nonlinearity (INL) of high resolution ADCs. Simulation results indicate that sine waves with SFDR<;40dB can be used to accurately identify the INL of 16-bit ADCs with the proposed methods.


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    Titel :

    Linearity testing of Analog-to-Digital Converters using imprecise sinusoidal excitations


    Beteiligte:
    Vasan, B K (Autor:in) / Chen, D J (Autor:in) / Geiger, R L (Autor:in)


    Erscheinungsdatum :

    01.07.2010


    Format / Umfang :

    1001388 byte





    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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