The number of missions devoted to the measurement of the magnetic field has dramatically decreased since the 80s, being the decrease in number accompanied by a reduction in the mass and economic budget of many of the exploration missions. This scenario was the seed for a new generation of sensors: the Commercial Off-The-Shelf (COTS) based microsensors. In the particular case of magnetometers, these miniaturized and compact devices imported a traditional problem of geomagnetic missions: the magnetic cleanliness trouble. Magnetic cleanliness, which is isolated in the platform when the magnetometer is deployed in a boom, becomes a real trouble when it has to be considered at Printed Circuit Board (PCB) level. In this work we present the description, method and results of a finite elements model for an engineering prototype of a NANOSAT-01 two axis magnetic sensor, launched in 2004. The idea is to extrapolate this method for all subsystems of a satellite.


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    Titel :

    Application of finite element methods to the analysis of magnetic contamination around electronics in magnetic sensor devices


    Beteiligte:


    Erscheinungsdatum :

    2012-05-01


    Format / Umfang :

    1449961 byte



    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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