This paper proposes a systematic study of IC immunity for a TX/RX digital system, implemented in a FPGA board. A DPI setup is used to measure the immunity of signal I/O ports to conducted continuous-wave interference. The injection path from RF noise source to input pin is characterized to define the injected power level causing a malfunction on the TX/RX system, up to 250 MHz. The impact of data coding on immunity measurement is analyzed by comparing error rates of Flexray coded data over a standard serial transmission protocol.
EM immunity study of serial links
2012-05-01
502007 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
EM Immunity Study of Serial Links
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