The separation and quantification of dielectric surface losses are achieved by measuring chemical vapour deposition (CVD) diamond disks both in hemispherical and symmetrical open resonators for arbitrary thickness of the disks. The measurement data are modelled by expressions based on impedance transformation (IT) theory to describe the contribution of each surface to the total loss.
Method for separating dielectric surface loss terms on CVD-diamond disks
2004-01-01
137206 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
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