A new technique to test BGA substrate using the electro-optic probing technique is investigated. This technique can detect open circuits in the BGA substrate with high spatial resolution. Measurement results of a real BGA substrate are reported.
Non-contact electrical test of the BGA substrate by electro-optic probing technique
2003-01-01
72834 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
Non-contact electrical test of the BGA substrate by electro-optic probing technique
British Library Conference Proceedings | 2003
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