A new technique is proposed to determine the permittivity and permeability of planar samples at millimeter wavelengths. The values of /spl epsiv/ and /spl mu/ are determined from the measurement of power reflected from the system planar specimen + metallic reflector for various positions of the reflector. The technique is realized using the precise quasioptical reflectometer.


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    Titel :

    A new technique for permittivity and permeability measurements at millimeter waves


    Beteiligte:
    Apletalin, V. (Autor:in) / Kazantsev, Yu. (Autor:in) / Solosin, V. (Autor:in) / Zubov, A. (Autor:in)


    Erscheinungsdatum :

    2004-01-01


    Format / Umfang :

    113939 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch




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