We evaluate VCSEL reliability for next-generation High Productivity Computers in which several hundreds of terabits of bandwidth are envisioned. An empirical relationship for VCSEL scaling versus bit rate and aperture is presented in order to explore reliability of VCSEL-based links. Reliability is found to degrade with aperture with a fourth order power law dependence. VSCEL sparing, water-cooling and redundancy though percentage of link failures are analyzed.


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    Titel :

    Scaling VCSEL reliability up to 250Terabits/s of system bandwidth


    Beteiligte:
    Cunningham, J. E. (Autor:in) / Beckman, D. (Autor:in) / McElfresh, D. (Autor:in) / Forrest, C. (Autor:in) / Cohen, D. (Autor:in) / Krishnamoorthy, A. V. (Autor:in)


    Erscheinungsdatum :

    01.06.2005


    Format / Umfang :

    546274 byte



    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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