The spatial distribution of electron density modulated by an external lateral confinement potential is directly imaged, indicating the formation of a periodic quantum dot array. We describe PL microscopy and spectroscopy of modulation doped GaAs-GaAlAs quantum well structures using near-field scanning optical microscopy to image the electron density distribution modulated by an external bias voltage.


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    Titel :

    Optical near-field spectroscopy of semiconductor nano-structures


    Beteiligte:
    Matsuda, K. (Autor:in) / Saiki, T. (Autor:in) / Saito, H. (Autor:in) / Nishi, K. (Autor:in) / Nomura, S. (Autor:in) / Aoyagi, Y. (Autor:in)


    Erscheinungsdatum :

    2001-01-01


    Format / Umfang :

    200169 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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