Summary form only given. Femtosecond time resolved measurement of optical phase is an important technique for characterizing ultrashort laser pulses and probing intense laser-matter interactions. For the latter, probe pulse phase shifts caused by laser induced plasma wakefields or the expansion of the critical density surface of solid density plasmas have been diagnosed by frequency domain interferometry (FDI) using multiple delay time steps between pump and probe. For such high intensity laser plasma interactions, the low repetition rate of multiterawatt class lasers and the sensitivity of such interactions to small laser fluctuations motivates the development of single shot phase diagnostic techniques. We present a new single shot ultrafast phase measurement technique based on an extension of FDI to the regime of frequency domain holography (FDH).


    Zugriff

    Zugriff prüfen

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Single shot measurement of optical phase by ultrafast frequency domain holography


    Beteiligte:
    Le Blanc, S.P. (Autor:in) / Gaul, E.W. (Autor:in) / Downer, M.C. (Autor:in)


    Erscheinungsdatum :

    01.01.1999


    Format / Umfang :

    289506 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



    Comparative evaluation of the image-reconstruction algorithms of single-shot phase-shifting digital holography

    Tahara, T. / Shimozato, Y. / Kakue, T. et al. | British Library Online Contents | 2012


    Ultrafast Optical Distortion Equalizer Using Time-Frequency Domain Processing (Invited Paper)

    Konishi, T. / Oshita, Y. / Itoh, K. | British Library Online Contents | 2006



    Measurement of Two Ultrashort Pulses in a Single Shot: Two-Pulse Frequency-Resolved Optical Gating

    IEEE; Lasers and Electro-Optics Society | British Library Conference Proceedings | 1993


    Ultrafast optical time-domain network technology

    Rauschenbach, K. / Hall, K. / Moores, J. et al. | IEEE | 1995