The techniques for defect detection on plain (unpatterned) fabrics have been well developed nowadays. This paper is on developing visual inspection methods for defect detection on patterned fabrics. A review on some defect detection methods on patterned fabrics is given. Then, a new method for patterned fabric inspection called Golden Image Subtraction (GIS) is introduced. GIS is an efficient and fast method, which can segment out the defective regions on patterned fabric effectively. An improved version of the GIS method using wavelet transform is also given. This research results contribute to the development of an automated fabric inspection machine for the textile industry.


    Zugriff

    Zugriff prüfen

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Defect detection on patterned jacquard fabric


    Beteiligte:
    Ngan, H.Y.T. (Autor:in) / Pang, G.K.H. (Autor:in) / Yung, S.P. (Autor:in) / Ng, M.K. (Autor:in)


    Erscheinungsdatum :

    2003-01-01


    Format / Umfang :

    2754623 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



    Defect Detection on Patterned Jacquard Fabric

    Ngan, H. / Pang, G. / Yung, S. et al. | British Library Conference Proceedings | 2004


    Jacquard fabric cushion production method

    WANG XIAODONG | Europäisches Patentamt | 2015

    Freier Zugriff

    Making method for jacquard fabric back cushion

    GAI XIAOLI | Europäisches Patentamt | 2015

    Freier Zugriff

    Defect detection in patterned wafers using anisotropic kernels

    Zontak, M. / Cohen, I. | British Library Online Contents | 2010


    Automated fabric defect detection-A review

    Ngan, H. Y. / Pang, G. K. / Yung, N. H. | British Library Online Contents | 2011