We demonstrate, for the first time, the deposition of an InP nanocrystal monolayer onto a processed silicon-on-insulator substrate containing nanophotonic devices. From the first results, propagation losses of 1.7 dB/mm were obtained for wires coated with InP nanocrystals compared to 0.26 dB/mm for the uncoated case.


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    Titel :

    InP-nanocrystal monolayer deposition onto silicon-on-insulator structures


    Beteiligte:
    Priem, G. (Autor:in) / Moreels, I. (Autor:in) / Dumon, P. (Autor:in) / Hens, Z. (Autor:in) / Bogaerts, W. (Autor:in) / Van Thourhout, D. (Autor:in) / Morthier, G. (Autor:in) / Baets, R. (Autor:in)


    Erscheinungsdatum :

    01.01.2005


    Format / Umfang :

    123755 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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