Validating simulations of inter-turn short circuits (ITSC) is a complex task, as it is complicated to find a resistor which is both precise in value as well as suitable for the power rating required. Most commercially available power resistors offer values of resistances greater than they occur in an ITSC. This paper presents a novel approach to emulating ITSCs with high precision, high flexibility and dynamics while adjusting the value of the resistance.


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    Titel :

    Emulation of an Inter-Turn Short Circuit with a Variable Fault Resistor


    Beteiligte:
    Braun, Lukas (Autor:in) / Becker, Tim (Autor:in) / Wagenaar, Enno (Autor:in) / Yu, Xinyi (Autor:in) / Pham, Duc (Autor:in) / De Doncker, Rik W. (Autor:in)


    Erscheinungsdatum :

    26.11.2024


    Format / Umfang :

    966748 byte





    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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