In this paper, we present a comprehensive methodology for a formal, but intuitive, cause-effect dependency modeling using multi-signal directed graphs that correspond closely to hierarchical system schematics and develop diagnostic strategies to isolate faults in the shortest possible time without making the unrealistic single fault assumption. A key feature of our methodology is that our models lend naturally to real-world necessities, such as system integration and hierarchical troubleshooting.<>


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    Titel :

    Multi-signal flow graphs: a novel approach for system testability analysis and fault diagnosis


    Beteiligte:
    Deb, S. (Autor:in) / Pattipati, K.R. (Autor:in) / Raghavan, V. (Autor:in) / Shakeri, M. (Autor:in) / Shrestha, R. (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    01.05.1995


    Format / Umfang :

    1253640 byte




    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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